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Study of chemical cleaning of surfaces by LEIS method
Staněk, Jan ; Polčák, Josef (referee) ; Bábor, Petr (advisor)
This thesis deal with studying chemical etched surfaces of cadmium telluride crystals (CdTe crystals) by low-energy ion scattering spectroscopy (LEIS method). In the theoretical part, there is description of physical essence of LEIS method, including experimental arrangement of Qtac100 instrument, on which the experiment is measured. The LEIS method is also compared with X-ray photoelectron spectroscopy (XPS). There is summary of properties and structure of CdTe crystals including principle of X-ray detectors, which are the primary use of the crystals. In experimental part there is a description of measuring process, starting with a calibration measurement, ongoing with a chemical etching and ending with a surface analysis. There are examples of LEIS spectra with comments and interpretation including comparison with XPS data.
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Analysis of Nanostructures by ToF-LEIS
Duda, Radek ; Král, Jaroslav (referee) ; Mašek, Karel (referee) ; Dub, Petr (advisor)
The presented thesis deals with the utilization of TOF-LEIS analytical method in the area of nanostructure analysis. A new procedure for depth profiling of the elemental composition of the sample, based on the alternate measurement with the DSIMS method, was established. The TOF-LEIS method is able to detect the interface between the layers before its mixing by the ion beam of the DSIMS method. Furthermore, a procedure of TOF-LEIS spektra modification was established to obtain the actual concentration of elements in the sample by reduction of a multiple collision contribution. By comparison of TOF-LEIS spectra with the results received by the DSIMS method the ratio of molybdenum and silicon ion yields was obtained. In the next section advantages of the TOF-LEIS method in combination with XPS during analysis of thermal stability of gold nanoparticles are presented. The mutual complementarity of both methods is shown and final conclusions are supported by electron microscopy images. The final section deals with a newly assembled apparatus for the TOF-SARS analytical method and shows its possibilities regarding the detection of hydrogen on the graphene.
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Study of chemical cleaning of surfaces by LEIS method
Staněk, Jan ; Polčák, Josef (referee) ; Bábor, Petr (advisor)
This thesis deal with studying chemical etched surfaces of cadmium telluride crystals (CdTe crystals) by low-energy ion scattering spectroscopy (LEIS method). In the theoretical part, there is description of physical essence of LEIS method, including experimental arrangement of Qtac100 instrument, on which the experiment is measured. The LEIS method is also compared with X-ray photoelectron spectroscopy (XPS). There is summary of properties and structure of CdTe crystals including principle of X-ray detectors, which are the primary use of the crystals. In experimental part there is a description of measuring process, starting with a calibration measurement, ongoing with a chemical etching and ending with a surface analysis. There are examples of LEIS spectra with comments and interpretation including comparison with XPS data.
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Analysis of Nanostructures by ToF-LEIS
Duda, Radek ; Král, Jaroslav (referee) ; Mašek, Karel (referee) ; Dub, Petr (advisor)
The presented thesis deals with the utilization of TOF-LEIS analytical method in the area of nanostructure analysis. A new procedure for depth profiling of the elemental composition of the sample, based on the alternate measurement with the DSIMS method, was established. The TOF-LEIS method is able to detect the interface between the layers before its mixing by the ion beam of the DSIMS method. Furthermore, a procedure of TOF-LEIS spektra modification was established to obtain the actual concentration of elements in the sample by reduction of a multiple collision contribution. By comparison of TOF-LEIS spectra with the results received by the DSIMS method the ratio of molybdenum and silicon ion yields was obtained. In the next section advantages of the TOF-LEIS method in combination with XPS during analysis of thermal stability of gold nanoparticles are presented. The mutual complementarity of both methods is shown and final conclusions are supported by electron microscopy images. The final section deals with a newly assembled apparatus for the TOF-SARS analytical method and shows its possibilities regarding the detection of hydrogen on the graphene.
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